​Next Generation IR Microscope
IRT-5X IR microscope is a comprehensive, versatile and productive system capable of measurement with high optical and spatial resolution. Using this system, many of the functions that are available at the microscopic level can be used to make powerful measurements at the microscopic level. IRT-5X is extremely useful for materials identification and imaging analysis to identify components and their distribution in complex matrices.
IRT-5X offers the enhanced functions: “Observation”, “Measurement” and “Usability”, providing new innovations in micro IR measurement.
Observation Enhancement
High-quality observation image and high sensitivity enhancement by newly designed optics
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Newly designed optics enables to provide a high quality observation image and a high sensitivity measurement with high throughput. Using a 5M pixel high-resolution camera, a high quality microscopic image is displayed on the PC monitor and recorded in the data file. Electric iris mechanism suppresses stray light, providing high accurate observation image.
X16 cassegrain (without using iris)
Sample (polyisoprene)
X16 cassegrain
(with using iris)
Sample (polyisoprene)
Easy optimization of microscope image
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NeIRT-5X is equipped with auto-focus, auto-brightness and auto-correct functions. All of these functions can be performed with one-click, enabling the acquisition of high-quality images. For samples that may be challenging to focus, such as KBr plates or the diamond anvil cell, the auto-focus function can easily perform this task.
Focus position 1
Sample (KBr plate sampling of multi layer film of food packing)
Focus position 2
Sample (KBr plate sampling of multi layer film of food packing)
A Variety of Monitoring Functions
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The direct-through function provides a microscopic image of the area which is obscured by the aperture. IQ Monitor allows the user to simultaneously confirm the sample image and the spectrum for determining the exact measurement point. In addition, polarization observation can be added, allowing the observation of plastics, polymers and fabrics.
Simple Design & Operation
Polarization observation of uniaxial stretching film
( conventional observation )
Polarization observation of uniaxial stretching film
( polarization observation )
Measurement Enhancement
Innovative IQ Mapping technology (JASCO patent)
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IQ Mapping uses the same mechanism as the 2D laser scanning function by galvano mirror equipped in laser microscope, allowing transmission/reflection mapping measurement through 2D scanning of infrared light on the sample. Since this function enables to perform the ATR mapping during contact of the sample with ATR crystal, there is no cross-contamination. The ClearView ATR cassegrain (ATR-5X-SD) allows the sample observation while in contact with ATR crystal, enabling point measurements after properly selecting the location.
The following pictures shows the ATR mapping measurement results of glitter in cosmetics by using ClearView ATR cassegrain (ATR-5X-SD)
Observation image
(before contacting sample with ATR crystal)
Observation image
(after contacting sample with ATR crystal)
Chemical Image
Powerful IQ Duo MCT detector and 4 detectors capability
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Standard midband MCT detector can perform IR measurement in low wavenumber range, down to 550 cm-1. IRT-5X supports the simultaneous installation of multiple detectors (up to 4 detectors*). IQ Duo MCT detector, DLATGS detector and InGaAs detector can be installed to IRT-5X and switched by software.
*When installing IQ Duo MCT detector, up to 4 detectors can be controlled.
Usability Enhancement
Operation improvement by newly designed user-interface of micro measurement program​
IQ Mapping uses the same mechanism as the 2D laser scanning function by galvano mirror equipped in laser microscope, allowing transmission/reflection mapping measurement through 2D scanning of infrared light on the sample. Since this function enables to perform the ATR mapping during contact of the sample with ATR crystal, there is no cross-contamination. The ClearView ATR cassegrain (ATR-5X-SD) allows the sample observation while in contact with ATR crystal, enabling point measurements after properly selecting the location.
Foreign material exploration by measurement support functions​
The following functions are available as measurement support function;
IQ IR NAV can recognize the measurement targets from observation image in real-time by image processing technology. It can also register the coordinates of these measurement targets and perform measurements. IR Advanced Search NAV can filter measurement targets based on specific conditions (such as size and circularity of sample) and display the spectral search results on observation image in real-time.
Easy replacement of condenser mirror by slide-in mechanism
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Since IRT-5X has a slide-in mechanism to insert the condensing mirror mounting, it is easy to exchange the condensing mirror with one with a different magnification.
JASCO Particle Analysis (standard)
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JASCO Particle Analysis can perform various dimension measurements based on the observation image and chemical image information. This program includes statistical processing, allowing the particle size histograms, frequency distributions, correlation distributions and component ratios.
Observation image (left)
Chemical image overlaid on observation image (right)
Particle size analysis
IRT-5X IR Microscope
Brochure
The IRT-5X IR Microscope is an amazing new technology for a myriad of applications...
To learn more about how the JASCO IR Microscope
could assist in your application please contact us on
freephone 0800 773 274 or email: info@specsci.nz