The JASCO NFS Series of scanning near-field optical microspectrometers have been optimized as a new solution for nanotechnology applications.
Traditionally, characterization methods on the nanometer scale consist of topography observation using an electron or scanning probe microscope or elemental analysis using an x-ray microanalyzer. These methods deliver images with high spatial resolution, but cannot obtain chemical information from a sample surface.
JASCO manufactures a variety of near-field probes with excellent transmission efficiency and a superior aperture control technology to enable high-precision near-field measurements.
The NFS-210/310 series is a near-field microscopy system incorporating a feedback mechanism for controlling the...
The NFS-220/320 series combines the precision of the NFS near-field microscope system with the additional excitation...
The NFS-230/330 series is an integrated near-field spectrometer system providing fluorescence and photoluminescence...
Rapid expansion of the IT industry has promoted extensive research and development on optical elements for...
Near Field Application Notes
Analysis of Protein-induced Calcium Carbonate Crystals in Soft Coral by Near-Field IR Microspectroscopy
Calcite Formation in Soft Coral Sclerites Is Determined by a Single Reactive Extracellular Protein
Multivariate Analysis Applied to Polymer Imaging Data Obtained by Near-Field Infrared Microscopy
Takayuki Yamagishi, Kenta Honobe, and Satoka Aoyagi
Faculty of Life and Environmental Science, Department of Materials and Life Science, Seikei University, Musashino-shi, Tokyo 180-8633, Japan
Panasonic Corporation, Moriguchi, Osaka, Japan
Corporate Engineering Division, Appliances Company, Panasonic Corporation, Kyoto, Japan
(Received 23 January 2017; Accepted 14 February 2017; Published 18 March 2017)
Chemical imaging techniques such as mass spectrometry (MS) imaging and imaging spectroscopy have grown to be important in a variety of fields. Infrared spectrum information, for example is essential to evaluate organic and biological samples. Recently, near-field spectroscopy techniques have been developed that enable higher spatial resolution above the one usually obtainable due to wavelength limitations. In terms of chemical imaging for organic materials, time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the powerful techniques because of extremely high sensitivity and high spatial resolution of approximately 100 nm. Since TOF-SIMS does not always provide complete information on complex samples, a complementary technique of similar spatial resolution is required. Near-field infrared microscope (NFIR) is the most promising candidate for a complementary analysis method along with TOF-SIMS.
On the other hand, traditional FT-IR, photoluminescence, or Raman microspectroscopy instruments can provide chemical data for a sample, but the spatial resolution is determined by the diffraction limit of light, limited to the wavelength of the light used. Scanning near-field microspectrometers allows characterization at the extreme nano level range exceeding the diffraction limit of light.
Introducing light into a fiber probe with an aperture of a hundred to several hundred nm produces near-field light of the same size as the probe aperture. Bringing the sample close to the probe aperture (within 100 nm) allows spectroscopic observations with a spatial resolution of several hundred nm as a result of the interaction of the near-field light with the sample surface.
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