MSV-5000 Series Microspectrophotometer
The MSV-5000 microscope system incorporates a double-beam scanning spectrophotometer for optimum measurements in the UV-Vis to NIR region (200-2700 nm).
Transmission measurement of Volvox by using MSV-5000 series
Thickness Analysis of natural oxide film on microscopic Si pattern
A broad range of applications including the collection of transmittance/reflectance spectra of a sample, measurement of the band gap and film thickness of semiconductors, evaluation of the optical characteristics of functional crystals and the color analysis of microscopic samples can be easily implemented using the MSV-5000 series.
The MSV-5000 series includes 3 different microscope systems:
The MSV-5100 is a dedicated UV-Vis microscope with a wavelength range of (200-900 nm).
The MSV-5200 includes a Peltier-cooled PbS detector and has a wavelength range of (200-2700 nm).
The MSV-5300 incorporates an InGaAs detector to obtain optimized NIR measurements and has a wavelength range of (200-1700 nm).
The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of expensive, coated refractive objectives. An optional automated XYZ stage also offers mapping/imaging capability for larger samples.
A PC-controlled objective carousel can be used to select any of the available 10X, 16X or 32X objectives in combination with the standard optical zoom feature to provide enhanced video imaging of the sample utilizing a high-resolution CMOS camera. Options include binocular viewing, polarized observation and selected refractive objective lenses.
All models incorporate a user-selectable slitwidth for variable spectral resolution as well as selectable circular apertures and an adjustable rectangular aperture for sample area discrimination.
Wide spectral measurement range
The microscope system utilizes wide-band cassegrain objectives to provide transmittance/reflectance measurements continuously from 200 to 2700 nm (MSV-5200).
An automated Glan-Taylor polarizer system (standard) provides polarization measurements in combination with the optional automated polarization analyzer.
Auto XYZ stage
The optional automated stage enhances the operation performance of the system especially for mapping and multi-point measurements.
JASCO Spectra Manager™ II
Spectra Manager™ II software, a cross-platform control and analysis package for all JASCO spectroscopic instruments, offers quick and easy data acquisition and analysis.
|Light Source (Option)|
|Wavelength Range||200 - 900 nm||200 - 2700 nm||200 - 1600 nm|
|Wavelength Accuracy||± 0.3 nm (656.1 nm)||
± 1.5 nm (1312.2 nm)
|Spectral Bandwidth||1, 2, 5, 10, L2, L5, L10 nm||1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
4, 8, 20, 40, L8, L20, L40 nm (NIR)
|1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
2, 4, 10, 20, L4, L10, L20 nm (NIR)
|Sample Observation (Option)|
(Automated condenser mirror compensation function)
10, 20, 30, 50, 100, 200 µmf (×16 objective)
5, 10, 15, 25, 50, 100 µmf (×32 objective)
16, 32, 48, 80, 160, 320 µmf (×10 objective)
|Sample Stage (Option)|
measurement start/stop, auto focus, automatic condenser mirror compensation, optical zoom,
automated sample illumination, sample compartment illumination ON/OFF, ATOS illumination ON/OFF
|Program (Option) *3|
*1. Cassegrain objective and cassegraing collection mirror are provided with the same magnification.
*2. The moving distance of the condensor mirror and the objective magni?cation depends upon the sample.
*3. Optional programs are provided when auto stage is selected.
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