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Material Science Instruments

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Based on more than 40 years of experience with spectroscopic instrumentation, JASCO offers advanced solutions for material science research with a variety of analytical and evaluation instruments supporting R&D as well as QC of material science devices, LCD's, thin films, materials research and many other key applications.

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Film Thickness

The thickness of the epitaxial layer, substrate, etching (residual layer), liquid crystal cell gap, and other semiconductor layers dramatically impacts...

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Absolute Reflectance

The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of...

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Ellipsometer

Ellipsometry is a method for determining the refractive index and extinction coefficients of a sample by measuring the change in...

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Microspectrophotometer

The MSV-5000 microscope system incorporates a double-beam scanning spectrophotometer for optimum measurements in the UV-Vis to NIR region (200-2700 nm).

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Raman Spectrometers

The NRS Series of bench top are based on JASCO’s proven technology emphasizing sensitivity, reliability, and ease of operation...

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Near Field Scanning

The NFS Series of scanning near-field optical microspectrometers have been optimized as a new solution for nanotechnology applications.

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Vacuums

The V-1000 was designed to evaluate optical properties in the wavelength range between 115 and 300 nm.

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Quantum Efficiency

A quantum efficiency measurement system for solid samples integrates the spectrofluorometer with an integrating sphere for fluorescence emission and a...

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Fluorescence Detector

JASCO's Confocal fluorescence detector can be used to determine the depth of the fluorescent contaminant without destroying the crucible.

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Supercritical Fluid

Perfluoropolyether (PFPE) is a lubricant widely used in many aerospace, vacuum, electronic and semiconductor applications due to its excellent chemical...

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