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Material Analysis Applications

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Title

UV-Vis

Absolute Reflectance Measurements of a Dichroic Mirror

UV-Vis

Amorphous Silicon Layer of a Solar Cell

FTIR

Analysis of Gases or Vapors with High Measurement Sensitivty

Raman

Carbon Nanotube Analysis by Raman Spectroscopy

Fluorescence

Chirality Analysis of Carbon Nanotubes

FTIR

Contaminant Analysis by Using IR Microscope

Raman

Contaminant in a Film

UV-Vis

Estimation of the Refractive Index of Monocrystalline Sapphire by Polarization Measurements using the MSV-5000 Series

FTIR

Evaluation of a Si Wafer Surface Using a 65-Degree Incident Angle ATR

Raman

Evaluation of Carrier Concentrations in GaN

UV-Vis

Evaluation of Filters and Mirrors

UV-Vis

Evaluation of ITO Films

Electric Field Modulation

Spectrophotometer

Evaluation of Organic EL Materials

Raman

Evaluation of Polysilicon

FTIR

In-Situ Monitoring for Chemical Vapor Deposition (CVD)

FTIR

Infrared Microscopy Mapping measurement using the IQ Mapping function of IRT-5000 Microscope

Fluorescence

Luminescent Color Measurement

NFS

Measurement of the Transition Process of a Semiconductor

UV-Vis

Monitoring of Polysilicon Crystallization Using a Laser

NFS

Nanometer scale characterization of a GaAsP semiconductor

FTIR

Non-Contact, Non-Destructive Film Thickness Measurements in the IR or NIR Region

UV-Vis

On-Line Monitoring for Quality Control

UV-Vis

Phase Difference Measurements

Raman

Polymer State Analysis During an Injection Molding Process

FTIR

Qualitative Analysis of Semiconductor Contaminants

Raman

Single-Layer Carbon Nanotube

SFC

The Analysis of Polymer Additives using Supercritical Fluid Chromatography

Ellipsometry

Thickness Distribution of Thin Films

UV-Vis

Transmission Measurement of Volvox Algae Using the MSV-5000 Series

Circular Dichroism

Unfolding of Concanavalin A by the Trifluoroethanol

UV-Vis

Absolute Reflectance Measurements of SiO2

FTIR

Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer

Raman

Analysis of Impurities in Polumers Using a Non-Destructive Measurement Method

Raman

Carbon Nanotube Analysis by Raman Spectroscopy

UV-Vis

Color Analyses of Fluorescence Materials for FPD

NFS

Contaminant Identification on Circuit Boards Using a Near-Field IR Spectrometer

Fluorescence

Development of New PDP Phosphors

NFS

Evaluation of a Luminescent Semiconductor on the Nanometer Scale

Raman

Evaluation of Carbon Materials

Raman

Evaluation of Diamond Like Carbon (DLC)

Fluorescence

Evaluation of Fluorescence Materials at a High Temperature

UV-Vis

Evaluation of Micro Optics

UV-Vis

Evaluation of Polarizers for FPDs

UV-Vis

Highly Accurate Measurements in the Vacuum UV Range

NFS

Infrared measurements with 1 µm spatial resolution

Fluorescence

Luminescence Efficiency Measurement

FTIR

Measurement of Oriented Films and Liquid Crystal Molecules by a Polarized ATR Accessory

FTIR

Model Analysis for FTIR Microscopy

Ellipsometry

Multi-Layer Film Analysis

NFS

Nanospectroscopy using a Near-Field Scanning Microspectrometer

FTIR

On-Line Monitoring by Using an Optical Fiber

NFS

Optical Evaluation of Write Spots in a CD-R by Transmittance Measurement

Ellipsometry

Photoelastic Constant Measurements

FTIR

Portable Instrument System for Micro FT-IR On-Site Analysis

Raman

Semiconductor Stress Measurement

UV-Vis

SiO2 Layer Thickness Measurement

UV-Vis

Thickness Analysis of a Natural Oxide Film on a Microscopic Si Pattern

Ellipsometry

Time-Resolved Measurements of Liquid Crystals

NFS

Transmittance Measurements in the UVVis/NIR Range at 100 nm to 1 µm Spatial Resolution